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      1. 阻性板表面光潔度對RPC性能的影響

         

        摘  要:北京譜儀最外層的MUON探測器采用國際上先進(jìn)的阻性板計數(shù)器(RPC)構(gòu)成,RPC共有978塊,這些RPC的性能是探測器性能的重要保證,針對于此采用每塊分析其中重要的3個參量來研究RPC性能,通過改變RPC的物理特性來提高這些參數(shù)。實(shí)驗在分析阻性板表面光潔度對阻性板探測器性能影響的同時,給出了實(shí)驗結(jié)果并加以圖形說明,展示了此探測器的良好性能和優(yōu)良的發(fā)展前景。

         

        關(guān)鍵詞:RPC;BES-III;MUON;探測器;性能

        中圖分類號:TL508, TL54+2        文獻(xiàn)標(biāo)識碼:A       

        文章編號:1672-4984(2008)01-0043-04

         

        Influence of resistive plate surface finish degree on RPC function

        YAO Ning, ZHANG Fei-Yun, CHEN Jing

        (College of Electronic and Information Engineer,Xuchang University,Xuchang 461000,China)

        Abstract: The outmost subsystem of Beijing spectrometer(BES), Muon counter was composed of 978 international advanced resistive plate counters (RPCs). Thus, the properties of those RPCs determined the function of Muon counter directly. The authors studied three important parameters of each RPC and tried to improve the physical characteristics through these parameters. Influence of resistive plate surface finish degree on RPC function was analyzed, at the same time the results were illustrated by figures. The above indicates that the counter has good performance and good prospects.

         

        Key words: RPC; BES-III; MUON; Counter; Function

         

        Editor:liyan




         
         
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